Speaker: Mr.Yin Bohao, technical staff
Time:6th April (Thursday), 2022
12:10-12:20, Sign up
12:20-12:40, Presentation
12:40-13:00, Free discussion
Location: Lecture Hall 221
Abstract: In nano-secondary ion probe mass spectrometry experiments, the flatness and conductivity of the sample surface has a significant impact on the measurement accuracy. This presentation will discuss the influence of sample condition on test results through several case studies and provide a brief overview of sample pretreatment equipment.
